The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2009
Filed:
Apr. 17, 2000
Method of testing bit error rates for a wavelength division multiplexed optical communication system
Jarod Guertin, Perry Hall, MD (US);
Michael J. Ransford, Millersville, MD (US);
Jarod Guertin, Perry Hall, MD (US);
Michael J. Ransford, Millersville, MD (US);
Ciena Corporation, Linthicum, MD (US);
Abstract
In a wavelength division multiplexed (WDM) optical communication system having optical transmitters and receivers communicating via a optical channels, the bit error rate (BER) for the optical channels is tested simultaneously by performing a BER measurement for the cascaded chain. A BER test signal is supplied from a BER tester to a first optical transmitter. The BER test signal passes through the optical channels. The last optical receiver in the cascaded chain supplies the test signal to the BER tester measure the BER. The measured BER is compared to a predetermined system BER threshold to determine if the optical channels meet their specified BER values. Each optical transmitter and receiver includes a performance monitoring circuit that monitors the quality of the BER signal supplied to the optical transmitter/receiver for identifying one or more optical channels that the measured BER exceeds a predetermined system BER threshold.