The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2009
Filed:
Apr. 28, 2006
Klaus Bavendiek, Norderstedt, DE;
Frank Herold, Ahrensburg, DE;
Klaus Bavendiek, Norderstedt, DE;
Frank Herold, Ahrensburg, DE;
Yxlon International X-Ray GmbH, Hamburg, DE;
Abstract
A method for automatic defect recognition in testpieces by means of an X-ray examination unit having a mechanical manipulator for positioning the testpiece in a beam path of the X-ray examination unit, wherein a positioning image of the testpiece is compared with an ideal reference image. An axis of rotation, an angle of rotation and a displacement vector are calculated in order to arrive at an exact congruence of the positioning image of the testpiece with the ideal reference image. The values of the axis of rotation, angle of rotation and displacement vector are then relayed to the mechanical manipulator and the latter then transfers the testpiece into the position corresponding to these values.