The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2009

Filed:

Jul. 19, 2006
Applicants:

Akihiko Nishide, Tokyo, JP;

Naoyuki Kawachi, Tokyo, JP;

Inventors:

Akihiko Nishide, Tokyo, JP;

Naoyuki Kawachi, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G21N 23/083 (2006.01); H05G 1/38 (2006.01);
U.S. Cl.
CPC ...
Abstract

A data acquisition device, which has an X-ray detector including a plurality of channel widths at which channels at its central portion are fine and channels at its peripheral portions are coarse or rough, and a plurality of data acquisition ranges including a data acquisition range wide in a channel direction and a data acquisition range narrow in the channel direction, and which is capable of performing switching among the data acquisition ranges for each data acquisition, is used to perform data acquisition on the channels fine at the central portion in the data acquisition range narrow in the channel direction, whereby an X-ray CT apparatus is provided which is capable of performing high-resolution imaging and brings about more satisfactory image quality.


Find Patent Forward Citations

Nishide, Akihiko. (2009). X-ray ct apparatus (U.S. Patent No. 7522695). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7522695

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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