The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2009
Filed:
Dec. 06, 2004
Applicant:
Ligang Zhang, Austin, TX (US);
Inventor:
Ligang Zhang, Austin, TX (US);
Assignee:
Silicon Laboratories Inc., Austin, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03D 3/24 (2006.01);
U.S. Cl.
CPC ...
Abstract
Jitter is measured by receiving a first reference signal at a first phase-locked loop (PLL) circuit and generating at an output of the first phase-locked loop circuit an output signal based at least in part on the first reference signal, the output signal including a jitter component to be measured. A signal corresponding to the output signal and a signal corresponding to the first reference signal are compared in a phase detector of a second phase-locked loop circuit. A value corresponding to an output of the comparison is stored that includes information indicative of the measured jitter component.