The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2009

Filed:

Mar. 04, 2005
Applicants:

Yoshiaki Inoue, Odawara, JP;

Fumikazu Kobayashi, Shizuoka-ken, JP;

Ikuo Kawauchi, Fujieda, JP;

Inventors:

Yoshiaki Inoue, Odawara, JP;

Fumikazu Kobayashi, Shizuoka-ken, JP;

Ikuo Kawauchi, Fujieda, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 15/00 (2006.01); H04N 1/405 (2006.01);
U.S. Cl.
CPC ...
Abstract

A dot pattern with a plurality of pixels representing a two-dimensional image is formed on a printing plate material by applying laser beams, which are turned on and off for each pixel depending on dot pattern data, to the printing plate material in a main scanning direction, while the laser beams are moved in an auxiliary scanning direction that is orthogonal to the main scanning direction. A threshold matrix having an array of thresholds is obtained for generating a dot where the degree of a variation of the dot periphery length in a main scanning direction is smaller, i.e., a dot where the dot periphery length in the main scanning direction has a smaller standard deviation.


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