The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2009
Filed:
Feb. 10, 2006
Eiji Takahashi, Kobe, JP;
Hiroyuki Takamatsu, Kobe, JP;
Masato Kannaka, Kobe, JP;
Naokazu Sakoda, Kobe, JP;
Tsutomu Morimoto, Kobe, JP;
Eiji Takahashi, Kobe, JP;
Hiroyuki Takamatsu, Kobe, JP;
Masato Kannaka, Kobe, JP;
Naokazu Sakoda, Kobe, JP;
Tsutomu Morimoto, Kobe, JP;
Kobe Steel, Ltd., Hyogo, JP;
Abstract
A liquid sample is irradiated with excitation light and measurement light, and a measurement position at which a traveling path of the measurement light passes through an excitation section of the excitation light in the sample is changed while the sample is being irradiated with the excitation light and the measurement light. Then, the phase change of the measurement light is measured for each measurement by optical interferometry on the basis of the measurement light after the measurement light passes through the sample. The measurement position is changed by, for example, scanning the excitation light, moving the sample, moving a lens that collects the excitation light in the sample so as to change the light-collecting position (focal position) in the sample, etc.