The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2009
Filed:
Sep. 23, 2004
Dieter Huhse, Berlin, DE;
Olaf Reimann, Berlin, DE;
Dieter Huhse, Berlin, DE;
Olaf Reimann, Berlin, DE;
Technische Universitaet Berlin, Berlin, DE;
Abstract
The aim of the invention is to provide a method for determining the frequency response of an electrooptical component, particularly, for example, of a light-generating or light-modulating component, which is easy to carry out. To this end, the invention provides a method during which optical pulses with a pulse frequency (fp) are generated. The electrooptical component () is controlled by an electrical measuring signal (Smess) with a measuring frequency (fmess) in such a manner that an optical output signal (Saus) is formed that is modulated with the measuring frequency (fmess). The measuring frequency (fmess) is equal to an integral multiple of the pulse frequency (fp) plus a predetermined frequency offset ($g(D)f). The pulses and the output signal (Saus) are mixed, and a mixed product (M) is detected whose modulation frequency corresponds to the predetermined frequency offset ($g(D)f). The mixed product indicates the frequency response of the electrooptical component () at the measuring frequency (fmess).