The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2009
Filed:
Feb. 21, 2006
Methods and apparatus for the improved measurement of circular and linear dichroism and uses thereof
Laurence A. Nafie, Cicero, NY (US);
Henry Buijs, Quebec, CA;
Laurence A. Nafie, Cicero, NY (US);
Henry Buijs, Quebec, CA;
Biotools, Inc., Jupiter, FL (US);
Abstract
The present invention is directed generally to an apparatus and methods that combine a novel four-port dual-source interferometer with double modulation FT-VCD or FT-VLD measurements to obtain a spectrometer with enhanced signal quality (S/N), and lower susceptibility to detector saturation. In the novel apparatus of the present invention, a linear polarizer or tandem array of identically-oriented polarizers is placed in front of each of the two sources in a four-port dual-source interferometer, with the polarization state of one of the linear polarizers (or tandem array of polarizers) vertical and the polarization state of the other linear polarizer (or tandem array of polarizers) horizontal, i.e., with the polarization axes of the polarizers orthogonal to one another. Methods for measuring these spectra using the various aspects of the apparatus of the present invention are also provided.