The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2009

Filed:

Jan. 10, 2007
Applicants:

Mitsuyoshi Tsuchiya, Hitachi, JP;

Michiya Okada, Mito, JP;

Fumio Iida, Hitachi, JP;

Hiromitsu Seino, Iwaki, JP;

Inventors:

Mitsuyoshi Tsuchiya, Hitachi, JP;

Michiya Okada, Mito, JP;

Fumio Iida, Hitachi, JP;

Hiromitsu Seino, Iwaki, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In an NMR apparatus provided with a split type magnet, in order to position a probe at a high precision in a narrow homogeneous magnetic field space, a positioning of a center of a probe coil is first located to a proper position by inserting an NMR probe from a horizontal bore. At this position, a sample tube is inserted from a vertical bore, and an NMR signal is measured from the probe coil. An NMR signal measuring apparatus amplifies the NMR signal from the probe coil, and executes an A/D conversion so as to determine an NMR spectrum signal, and an NMR signal analyzing apparatus compares the NMR spectrum signal. A probe is set at a position where a sharpness of the spectrum is largest, that is, a magnetic field homogeneity coefficient is high, by repeating the operations mentioned above.


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