The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2009

Filed:

Jun. 25, 2004
Applicants:

Gopichand Katragadda, Karnataka, IN;

Manoj Kumar Koyithitta Meethal, Kerala, IN;

Slvaramanivas Ramaswamy, Karnataka, IN;

Amitabha Dutta, Orissa, IN;

Inventors:

Gopichand Katragadda, Karnataka, IN;

Manoj Kumar Koyithitta Meethal, Kerala, IN;

Slvaramanivas Ramaswamy, Karnataka, IN;

Amitabha Dutta, Orissa, IN;

Assignee:

General Electric Company, Niskayuna, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In accordance with one embodiment, the present technique provides a testing apparatus for testing material integrity in an object. The testing apparatus includes an electrical conductor and a sensing device. In the exemplary testing device, the electrical conductor extends in a generally linear direction and is configured to route current in a direction generally transverse to a longitudinal axis of the object being tested. Routing of current through the electrical conductor creates remote field eddy current effect, which, in turn, affects a magnetic field around the test object. The testing apparatus also includes a sensing device located at a distance from the electrical conductor and configured to detect magnetic fields generated in response to current routed through the electrical conductor.


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