The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2009
Filed:
Mar. 15, 2005
Naotoshi Kirihara, Tokyo, JP;
Norifumi Kitada, Tokyo, JP;
Kenji Takahashi, Tokyo, JP;
Haruaki Yoshida, Tokyo, JP;
Mizuho Tanaka, Tokyo, JP;
Yasuo Suzuki, Tokyo, JP;
Naotoshi Kirihara, Tokyo, JP;
Norifumi Kitada, Tokyo, JP;
Kenji Takahashi, Tokyo, JP;
Haruaki Yoshida, Tokyo, JP;
Mizuho Tanaka, Tokyo, JP;
Yasuo Suzuki, Tokyo, JP;
Kabushiki Kaisha IDX Technologies, Tokyo, JP;
Abstract
The invention provides an ultra-sonic jet multi-photon resonance ionization type mass analyzing device. The laser beam ionization mass analyzing device includes a pulsed gas ejecting devicefor ejecting in pulse mode carrier gas containing sample molecules into a vacuum vessel, a laser beam irradiation system for irradiating laser beam for selective photo-reaction of sample molecules in said pulsed gas, repeller and extraction electrodesandgenerating an electric field for extraction of sample molecular ions generated by the photo reaction and a mass analyzing devicefor mass analysis of extracted sample molecular ions. The laser beam irradiation system is set to irradiate laser beam to sample molecules near a position whereat a pressure time distribution of pulsed gas translating in the vacuum vesseltransitions from a flat-top pressure distribution to a triangular pressure distribution.