The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2009

Filed:

Jun. 07, 2005
Applicant:

Woon Suh Paik, Ansan-si, Gyeonggi-do, KR;

Inventor:

Woon Suh Paik, Ansan-si, Gyeonggi-do, KR;

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/20 (2006.01); H01L 21/84 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of crystallizing an amorphous semiconductor thin film used for a thin film transistor (TFT) is provided. The method includes the steps of: forming first and second crystallization induced metal patterns locally in respective portions of a source region and a drain region of the TFT on an amorphous semiconductor thin film; and crystallizing an amorphous semiconductor via independent two-times heat treatment using the first and second crystallization induced metal patterns. In this case, the independent two-times heat treatment is executed before and after ions of impurities are injected, respectively. In this way, a metal induced lateral crystallization double heat treatment is executed before and after ions of impurities are injected, respectively. As a result, the entire crystallization heat treatment time necessary for crystallizing the amorphous semiconductor thin film can be greatly reduced, and a poly-crystalline TFT having low leakage current can be obtained.


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