The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2009
Filed:
Nov. 16, 2005
Patrick T. Petruno, San Jose, CA (US);
John F. Petrilla, Palo Alto, CA (US);
Michael J. Brosnan, Fremont, CA (US);
Rong Zhou, Sunnyvale, CA (US);
Daniel B. Roitman, Menlo Park, CA (US);
BO U. Curry, Redwoord City, CA (US);
Patrick T. Petruno, San Jose, CA (US);
John F. Petrilla, Palo Alto, CA (US);
Michael J. Brosnan, Fremont, CA (US);
Rong Zhou, Sunnyvale, CA (US);
Daniel B. Roitman, Menlo Park, CA (US);
Bo U. Curry, Redwoord City, CA (US);
Abstract
An assay test strip includes a flow path, a sample receiving zone, a label, a detection zone that includes a region of interest, and at least one position marker. The at least one position marker is aligned with respect to the region of interest such that location of the at least one position marker indicates a position of the region of interest. A diagnostic test system includes a reader that obtains light intensity measurement from exposed regions of the test strip, and a data analyzer that performs at least one of (a) identifying ones of the light intensity measurements obtained from the test region based on at least one measurement obtained from the at least one reference feature, and (b) generating a control signal modifying at least one operational parameter of the reader based on at least one measurement obtained from the at least one reference feature.