The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2009

Filed:

Jul. 02, 2008
Applicants:

John N. Hryckowian, Raleigh, NC (US);

Heidi L. Lagares-vazquez, Highland, NY (US);

Ray Raphy, Poughkeepsie, NY (US);

Alan Daniel Stigliani, Hopewell Junction, NY (US);

Charles Vakirtzis, New Winsor, NY (US);

Inventors:

John N. Hryckowian, Raleigh, NC (US);

Heidi L. Lagares-Vazquez, Highland, NY (US);

Ray Raphy, Poughkeepsie, NY (US);

Alan Daniel Stigliani, Hopewell Junction, NY (US);

Charles Vakirtzis, New Winsor, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

Wiring structures and methods for integrated circuit designs which are adapted to reduce metal variation effects on launch-capture clock pairs in order to minimize cycle time overlap violations in launch/capture clocking systems are provided, whereby the A/B/C (test/launch/capture) clock wire nets are designed using a five parallel track wire segment, in which the B clock wire is represented as a double track with one metal track and one adjacent isolation/shielding track, the C clock wire is represented as a double track with one metal track and one adjacent isolation/shielding track, and where the A test clock wire is represented as a single track comprising test signal wire disposed between the B and C signal wires.


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