The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2009
Filed:
Jan. 05, 2006
Applicants:
Michael M. Tsao, Yorktown Heights, NY (US);
R. Brett Tremaine, Stormville, NY (US);
Inventors:
Michael M. Tsao, Yorktown Heights, NY (US);
R. Brett Tremaine, Stormville, NY (US);
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract
We describe, in exemplary embodiments, an on-chip Functional Built-In Self Test ('FBIST') mechanism for testing integrated circuits with internal memory state and complex transaction based interfaces. Such interfaces include system-on-chip applications, memory chip applications, and input/output ('IO') protocol adapter chips.
Tsao, Michael. (2009). Apparatus and method for integrated functional built-in self test for an asic (U.S. Patent No. 7519886). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7519886
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile