The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7519879 B1

PDF
Full Text
Expired
Date of Patent:
Apr. 14, 2009

Filed:

Aug. 20, 2004
Applicants:

Joel D Woodward, Colorado Springs, CO (US);

Adrian M Hernandez, Colorado Springs, CO (US);

James B Stewart, Iii, Colorado Springs, CO (US);

Inventors:

Joel D Woodward, Colorado Springs, CO (US);

Adrian M Hernandez, Colorado Springs, CO (US);

James B Stewart, III, Colorado Springs, CO (US);

Assignee:

Agilent Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/3177 (2006.01); G01R 31/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

A dynamic probe system for probing a FPGA with at least one core. A trace core is added to the FPGA, the trace core in communication with a plurality of signal banks, each signal bank comprising a plurality of signals in the at least one core. A logic analyzer, in communication with the trace core and selecting the bank of signal to be sent from the trace core to the logic analyzer.


Find Patent Forward Citations

Woodward, Joel. (2009). Apparatus and method for dynamic in-circuit probing of field programmable gate arrays (U.S. Patent No. 7519879). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7519879

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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