The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2009

Filed:

Mar. 28, 2006
Applicants:

Jerry Y. Goldman, New City, NY (US);

Patricia Florissi, Briarcliff Manor, NY (US);

Jeffrey A. Schriesheim, Lexington, MA (US);

Amanuel Ronen Artzi, Framingham, MA (US);

Inventors:

Jerry Y. Goldman, New City, NY (US);

Patricia Florissi, Briarcliff Manor, NY (US);

Jeffrey A. Schriesheim, Lexington, MA (US);

Amanuel Ronen Artzi, Framingham, MA (US);

Assignee:

EMC Corporation, Hopkinton, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01); G06F 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method, system and computer product for performing a system analysis of a surveillance network containing a plurality of components. The method comprises the steps of representing selected ones of the plurality of components, providing a mapping between a plurality of observable events and a plurality of causing events occurring in components, wherein the observable events are at least associated with each of the at least one components, and determining at least one likely causing event based on at least one of the plurality of observable events by determining a measure between each of a plurality of values associated with the plurality of observable events and the plurality of causing events.


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