The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2009
Filed:
May. 02, 2007
Peter Miller, New London, CT (US);
Jan Henrik Ardenkjaer-larsen, Frederiksberg C, DK;
Martin John Bradney, Herefordshire, GB;
Andrew Michael Leach, Clifton Park, NY (US);
Per Christian Sontum, Oslo, NO;
Eric John Telfeyan, Guilderland, NY (US);
David Brandon Whitt, Albany, NY (US);
Jan Wolber, Hertfordshire, GB;
Peter Miller, New London, CT (US);
Jan Henrik Ardenkjaer-Larsen, Frederiksberg C, DK;
Martin John Bradney, Herefordshire, GB;
Andrew Michael Leach, Clifton Park, NY (US);
Per Christian Sontum, Oslo, NO;
Eric John Telfeyan, Guilderland, NY (US);
David Brandon Whitt, Albany, NY (US);
Jan Wolber, Hertfordshire, GB;
General Electric Company, Niskayuna, NY (US);
Abstract
The present invention provides an apparatus and method for automated quality control of a substance comprising a compartment wherein a substance is located, a monitoring device coupled to the compartment and configured to monitor at least one quality control parameter prior to an end-use of the substance, and a processor coupled to the monitoring device, wherein the monitoring device is configured to communicate data to the processor for comparing at least one quality control parameter to an end-use value, and wherein the processor is further configured to control the release of the substance from the compartment to its end-use.