The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2009

Filed:

Sep. 09, 2005
Applicants:

Raphael Hirsch, Pittsburgh, PA (US);

James Osborn, Oakmont, PA (US);

Chian Kent Kwoh, Pittsburgh, PA (US);

Louis J. Denes, Pittsburgh, PA (US);

Daniel Huber, Pittsburgh, PA (US);

Inventors:

Raphael Hirsch, Pittsburgh, PA (US);

James Osborn, Oakmont, PA (US);

Chian Kent Kwoh, Pittsburgh, PA (US);

Louis J. Denes, Pittsburgh, PA (US);

Daniel Huber, Pittsburgh, PA (US);

Assignee:

Other;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01N 23/223 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of objectively quantifying assessments of joints having arthritis for purposes of assessment, diagnosis and treatment. The objective measurements utilize known imaging modalities including 3D scanning, thermal imaging, visible and near-infrared imaging and two-dimensional imaging to quantify swelling, heat distribution, erythema, and range or motion. The objective measurements can be combined in various ways to assess the extent of the disease and can be used to adjust treatment protocols.


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