The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2009

Filed:

Mar. 16, 2007
Applicants:

Steven Jon Horstman, San Diego, CA (US);

William M. Fries, San Diego, CA (US);

William Adams Heindl, San Diego, CA (US);

Inventors:

Steven Jon Horstman, San Diego, CA (US);

William M. Fries, San Diego, CA (US);

William Adams Heindl, San Diego, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G21K 1/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method for calibrating a radiation imaging system include a dual use variable thickness radiation filter having a slit in one part thereof such that in a first position a radiation beam passing through is not attenuated and in a second position the radiation beam is attenuated according to the total filter thickness in the path of the radiation beam. The filter may be formed of multiple movable plates or a single piece of stepped high density material.


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