The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7518772 B1

PDF
Full Text
Expired
Date of Patent:
Apr. 14, 2009

Filed:

Oct. 11, 2006
Applicant:

Hideki Okamura, Osaka, JP;

Inventor:

Hideki Okamura, Osaka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 26/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

By magnifying a beam light from a polarizer by a scanning lens (also referred to as a magnifying lens) and a decentered lens (serving as a correcting lens) which is a lens arranged in a side of a scanning surface with an axis thereof decentered relative to a light axis of the beam light, a spherical aberration normally exacerbated by magnifying the beam light by the scanning lens is suppressed. In addition, even if the scanning lens and the correcting lens are arranged close to the polarizer, main scanning magnification is kept small and spherical aberration is suppressed.


Find Patent Forward Citations

Okamura, Hideki. (2009). Scanning optical apparatus (U.S. Patent No. 7518772). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7518772

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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