The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2009

Filed:

Nov. 14, 2005
Applicants:

In-duk Hwang, Suwon-si, KR;

Sang-hoon Shin, Seongnam-si, KR;

Ki-wang Kim, Donbong-gu, KR;

Inventors:

In-duk Hwang, Suwon-si, KR;

Sang-hoon Shin, Seongnam-si, KR;

Ki-wang Kim, Donbong-gu, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of acquiring a vertical section image of lingual fur, and an apparatus to perform the method, the method including generating interfering light from irradiated light and light reflected from a tongue tissue, and generating a partial image corresponding to a relative intensity of the generated interfering light.


Find Patent Forward Citations

Hwang, In-duk. (2009). Apparatus and method of measuring thickness of lingual fur and acquiring vertical section image thereof (U.S. Patent No. 7518734). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7518734

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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