The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2009

Filed:

Nov. 29, 2006
Applicants:

John A. Adams, Escondido, CA (US);

Kristina M. Crousore, Oceanside, CA (US);

Cherish K. Teters, San Diego, CA (US);

John Ricardi, Camarillo, CA (US);

David L. Mccarty, Cincinnati, OH (US);

Michael Tutrow, Solana Beach, CA (US);

Inventors:

John A. Adams, Escondido, CA (US);

Kristina M. Crousore, Oceanside, CA (US);

Cherish K. Teters, San Diego, CA (US);

John Ricardi, Camarillo, CA (US);

David L. McCarty, Cincinnati, OH (US);

Michael Tutrow, Solana Beach, CA (US);

Assignee:

JMAR Technologies, Inc., San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 15/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A particle detection system to identify and classify particles is programmed to capture digitized images of the particle generated by directing a light source through a fluid that includes the particle. The particle scatters the light and the scattered light is detected using a detector. The detector creates a digital signal corresponding to the particle, which is used by the system to generate a Bio-Optical Signature. This Bio-Optical Signature can then be used to classify the event, or particle. A count rate of the classified particles is monitored to detect a change that is representative of a toxin attack.


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