The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2009

Filed:

Jan. 03, 2005
Applicants:

Adam L. Cohen, Los Angeles, CA (US);

Michael S. Lockard, Lake Elizabeth, CA (US);

Kieun Kim, Pasadena, CA (US);

Qui T. Le, Anaheim, CA (US);

Gang Zhang, Monterey Park, CA (US);

Uri Frodis, Los Angeles, CA (US);

Dale S. Mcpherson, Kissimmee, FL (US);

Dennis R. Smalley, Newhall, CA (US);

Inventors:

Adam L. Cohen, Los Angeles, CA (US);

Michael S. Lockard, Lake Elizabeth, CA (US);

Kieun Kim, Pasadena, CA (US);

Qui T. Le, Anaheim, CA (US);

Gang Zhang, Monterey Park, CA (US);

Uri Frodis, Los Angeles, CA (US);

Dale S. McPherson, Kissimmee, FL (US);

Dennis R. Smalley, Newhall, CA (US);

Assignee:

Microfabrica Inc., Van Nuys, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B81C 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Some embodiments of the present invention are directed to techniques for building up single layer or multi-layer structures on dielectric or partially dielectric substrates. Certain embodiments deposit seed layer material directly onto substrate materials while other embodiments use an intervening adhesion layer material. Some embodiments use different seed layer materials and/or adhesion layer materials for sacrificial and structural conductive building materials. Some embodiments apply seed layer and/or adhesion layer materials in what are effectively selective manners while other embodiments apply the materials in blanket fashion. Some embodiments remove extraneous depositions (e.g. depositions to regions unintended to form part of a layer) via planarization operations while other embodiments remove the extraneous material via etching operations. Other embodiments are directed to the electrochemical fabrication of multilayer mesoscale or microscale structures which are formed using at least one conductive structural material, at least one conductive sacrificial material, and at least one dielectric material. In some embodiments the dielectric material is a UV-curable photopolymer.


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