The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2009
Filed:
Nov. 03, 2006
Harry Israel Ringermacher, Delanson, NY (US);
Donald Robert Howard, Troy, NY (US);
Bryon Edward Knight, Charlton, NY (US);
Yury Alexeyevich Plotnikov, Niskayuna, NY (US);
Mark John Osterlitz, Schenectady, NY (US);
Jian LI, Schenectady, NY (US);
Jeffry Lynn Thompson, Ballston Spa, NY (US);
Gulperi Nuzhet Aksel, Clifton Park, NY (US);
Harry Israel Ringermacher, Delanson, NY (US);
Donald Robert Howard, Troy, NY (US);
Bryon Edward Knight, Charlton, NY (US);
Yury Alexeyevich Plotnikov, Niskayuna, NY (US);
Mark John Osterlitz, Schenectady, NY (US);
Jian Li, Schenectady, NY (US);
Jeffry Lynn Thompson, Ballston Spa, NY (US);
Gulperi Nuzhet Aksel, Clifton Park, NY (US);
General Electric Company, Niskayuna, NY (US);
Abstract
A system for locating a failure event in a sample is disclosed. The system includes at least one sensor configured to detect acoustic energy corresponding to the failure event in the sample. The system also includes an infrared camera configured to detect a thermal release of energy corresponding to the failure event in the sample.