The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2009
Filed:
Sep. 14, 2006
Katsumi Homma, Kawasaki, JP;
Toshiyuki Shibuya, Kawasaki, JP;
Hidetoshi Matsuoka, Kawasaki, JP;
Izumi Nitta, Kawasaki, JP;
Katsumi Homma, Kawasaki, JP;
Toshiyuki Shibuya, Kawasaki, JP;
Hidetoshi Matsuoka, Kawasaki, JP;
Izumi Nitta, Kawasaki, JP;
Fujitsu Limited, Kawasaki, JP;
Abstract
A delay analyzing apparatus receives a result of timing analysis of a target circuit, and detects, from paths in the target circuit, critical paths based on the result of the timing analysis with a detecting unit. A first calculating unit calculates an average delay distribution of the paths other than the critical paths based on an average delay value of each of the critical paths. A second calculating unit calculates a probability density distribution of the critical paths, and a third calculating unit calculates a probability density distribution of all of the paths based on the average delay distribution. A fourth calculating unit calculates difference between a statistical delay value of the critical paths and a statistical delay value of all of the paths based on the probability density distribution of the critical paths and the probability density distribution of all of the paths.