The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2009
Filed:
Apr. 11, 2006
Applicants:
Yzhar Keysar, Kohav Yair, IL;
Anatoli Shindler, Jerusalem, IL;
Yuri Miroshnik, Naaleh, IL;
Inventors:
Assignee:
Silicon Design Systems Ltd., Jerusalem, IL;
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract
Methods and apparatus for validating design changes in an integrated circuit design without propagating the effects of individual design changes to every location in the integrated circuit design. Local sensitivity functions at design nodes are aggregated and merged at interconnecting nodes in a recursive process.
Keysar, Yzhar. (2009). Methods and apparatus for validating design changes without propagating the changes throughout the design (U.S. Patent No. 7516431). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7516431
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile