The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2009
Filed:
Oct. 20, 2004
Osamu Okano, Kawasaki, JP;
Hideaki Konishi, Kawasaki, JP;
Osamu Okano, Kawasaki, JP;
Hideaki Konishi, Kawasaki, JP;
Fujitsu Microelectronics Limited, Tokyo, JP;
Abstract
A test circuit tester includes a scan-chain input-output information generator that generates information for an input and an output of the scan chain that is scan-chain input-output information, based on input information for the scan chain; a test-circuit input-output information generator that generates information for an input and an output of the test circuit that is test-circuit input-output information, based on the scan-chain input-output information; an output unit that outputs the test-circuit input-output information generated; and a verifying unit that verifies the test circuit based on an output pattern output from the test circuit through the scan chains in response to input of the information for the input of the test circuit output to the test circuit, and the information for the output from the test circuit.