The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2009
Filed:
Jan. 31, 2003
Thomas Maucksch, Tuntenhausen, DE;
Uwe Baeder, Ottobrunn, DE;
Thomas Maucksch, Tuntenhausen, DE;
Uwe Baeder, Ottobrunn, DE;
Rohde & Schwarz GmbH & Co. KG, Munich, DE;
Abstract
A method for testing the (Bit) Error Ratio BER of a device against a maximal allowable (Bit) Error Ratio BERwith an early pass and/or early fail criterion, whereby the early pass and/or early fail criterion is allowed to be wrong only by a small probability F for the entire test. Ns bits of the output of the device are measured, thereby ne erroneous bits of these ns bits are detected. PDand/or PDare obtained, whereby PDis the worst possible likelihood distribution and PDis the best possible likelihood distribution containing the measured ne erroneous bits with a single step wrong decision probability D, which is smaller than the probability F for the entire test. The average numbers of erroneous bits NEand NEfor PDand PDare obtained. NEand NEare compared with NE=BERns. If NEis higher than NEor NEis lower than NEthe test is stopped. Sequential sampling with two one-tailed parametric hypothesis test for the poisson distribution.