The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2009

Filed:

Jul. 30, 2004
Applicants:

Hisao Inami, Matsudo, JP;

Yasuhiko Sasaki, Tsuchiura, JP;

Hajime Katou, Chiyoda, JP;

Ryo Miyake, Tsukuba, JP;

Inventors:

Hisao Inami, Matsudo, JP;

Yasuhiko Sasaki, Tsuchiura, JP;

Hajime Katou, Chiyoda, JP;

Ryo Miyake, Tsukuba, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

There is provided a group of testing apparatuses that realizes high-level testing and high quality medical treatment by conducting tests using apparatuses and facilities that are located in a distributed condition. A distributed testing apparatus is configured to be connectable to a network system to which a host testing apparatus is connected, wherein the distributed testing apparatus has a testing part that assays genetic information of a specimen, a transmission part that transmits test results information of the testing part and a specimen ID corresponding to the specimen to the host testing apparatus through the network, a receiver part that receives through the network assessment information from the host testing apparatus that corresponds to the transmitted test results information, and an output part that outputs the received information.


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