The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2009

Filed:

May. 19, 2006
Applicants:

Mao Chen, Green Island, NY (US);

Mitchell A. Cohen, Yorktown Heights, NY (US);

Rakesh Mohan, Cortlandt Manor, NY (US);

Ram Rajagopal, Berkeley, CA (US);

Jakka Sairamesh, New York, NY (US);

Stephen V. Stibler, Ossining, NY (US);

Inventors:

Mao Chen, Green Island, NY (US);

Mitchell A. Cohen, Yorktown Heights, NY (US);

Rakesh Mohan, Cortlandt Manor, NY (US);

Ram Rajagopal, Berkeley, CA (US);

Jakka Sairamesh, New York, NY (US);

Stephen V. Stibler, Ossining, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

Techniques are provided for ranking-based information processing. Method steps can include integrating information from at least one source (a plurality of heterogeneous sources can also be handled), to obtain integrated information; mapping the integrated information to at least one application; ranking the integrated information based on the mapping and on ranking criteria from a knowledge base; and processing the integrated information, based on the ranking, to obtain processed integrated information. Optionally, the processing step includes formatting the processed integrated information for a plurality of applications.


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