The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2009

Filed:

Jul. 07, 2006
Applicants:

Robert J. Chimenti, Short Hills, NJ (US);

Bruce N. Perry, Flemington, NJ (US);

Inventors:

Robert J. Chimenti, Short Hills, NJ (US);

Bruce N. Perry, Flemington, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 6/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention includes a method and system of measuring alteration, alteration type, and alteration-causing species in process fluids and equipment and for controlling the process feeds and conditions to maximize the yields and equipment lifetime by minimizing the alteration. The invention includes an optical sensor comprising an optical fiber, a fiber grating written within the optical fiber, strain-tuned elements fixed to the optical fiber and an unaltered element, and an altered element fixed to the unaltered element.


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