The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2009

Filed:

Aug. 19, 2005
Applicants:

John L. Miller, Lake Oswego, OR (US);

Cynthia Iseman Archer, Beaverton, OR (US);

Milton S. Worley, Lake Oswego, OR (US);

Inventors:

John L. Miller, Lake Oswego, OR (US);

Cynthia Iseman Archer, Beaverton, OR (US);

Milton S. Worley, Lake Oswego, OR (US);

Assignee:

FLIR Systems, Inc., Wilsonville, OR (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems, including apparatus and methods, for obtaining and/or correcting images, particularly from atmospheric and/or other distortions. These corrections may involve, among others, determining corrective information in a first (e.g., visible) wavelength regime, and then applying the corrective information in a second (e.g., longer) wavelength regime, such as infrared (IR) or millimeter-wave (MMW) wavelengths, in real time or with post-processing. For example, these corrections may include scaling a phase diversity correction from one wavelength to another. These systems may be useful in any suitable imaging context, including navigation, targeting, search and rescue, law enforcement, and/or surveillance, among others.


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