The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2009
Filed:
Apr. 25, 2005
Hiroshi Iwamoto, Osaka, JP;
Yoshiyuki Tani, Osaka, JP;
Takao Hisazumi, Osaka, JP;
Yukihiro Iwata, Osaka, JP;
Etsuyoshi Sakaguchi, Osaka, JP;
Hiroshi Iwamoto, Osaka, JP;
Yoshiyuki Tani, Osaka, JP;
Takao Hisazumi, Osaka, JP;
Yukihiro Iwata, Osaka, JP;
Etsuyoshi Sakaguchi, Osaka, JP;
Panasonic Corporation, Osaka, JP;
Abstract
In a fluorescent X-ray analysis method, a sample () is set on a sample stage () on an upper side of an X-ray irradiation chamber () and a sample cover () is closed from the upper part of the sample () to surround the sample (), and then, a lower plane of the sample () is irradiated with X-ray for analysis. When the sample () is set on the sample stage () and the sample cover () is closed, a cover detecting means () detects that the sample cover () is closed and X-ray is automatically projected from an X-ray source () to start analysis.