The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2009

Filed:

Mar. 03, 2004
Applicants:

William Llewellyn, San Jose, CA (US);

Seema Varma, Sunnyvale, CA (US);

Ha Chu VU, San Jose, CA (US);

Inventors:

William Llewellyn, San Jose, CA (US);

Seema Varma, Sunnyvale, CA (US);

Ha Chu Vu, San Jose, CA (US);

Assignee:

National Semiconductor Corporation, Santa Clara, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/40 (2006.01); H04N 1/46 (2006.01); H04N 1/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

Circuits, devices, and methods for enabling the digitization of scanned images with an Analog Front End (AFE) circuit. The AFE circuit includes a sampler for sampling a signal produced by an image sensor and in response generating analog image samples. The AFE circuit also includes a Programmable Gain Amplifier for generating amplified samples by amplifying the analog image samples. The AFE circuit further includes an Analog to Digital Converter for generating digitized samples from the amplified samples; and a Digital Programmable Gain Amplifier for amplifying the digitized samples which are subsequently presented to a processor for further processing of the scanned image. Accordingly, the scanned image is digitized with amplification taking place both in the analog and in the digital domain, deriving benefits from each. The AFE circuit may be calibrated in two steps, once for each of the domains.


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