The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2009

Filed:

Nov. 03, 2006
Applicants:

Peter Ehbets, Zürich, CH;

Wolfgang Geissler, Bad Schönborn, DE;

Adrian Kohlbrenner, Thalwil, CH;

Inventors:

Peter Ehbets, Zürich, CH;

Wolfgang Geissler, Bad Schönborn, DE;

Adrian Kohlbrenner, Thalwil, CH;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/25 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a method for determining color and/or density values for use in monitoring and regulating a printing process in a printing apparatus, specifically in a sheet-fed offset printing press, measuring areas of a printed sheet are measured photoelectrically during the printing process, directly in or on the running printing apparatus. From the measured values obtained in the process, the color and/or density values for the relevant measuring areas are formed. From the measurement, measured value deviations caused directly in the printing process with respect to a measurement outside the printing process can be corrected computationally.


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