The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2009
Filed:
Aug. 31, 2007
Jason T. Albert, Rochester, MN (US);
William T. Bronk, Shelburne, VT (US);
Timothy J. Eby, Austin, TX (US);
Michael J. Hamilton, Rochester, MN (US);
Norman K. James, Liberty Hill, TX (US);
Jason T. Albert, Rochester, MN (US);
William T. Bronk, Shelburne, VT (US);
Timothy J. Eby, Austin, TX (US);
Michael J. Hamilton, Rochester, MN (US);
Norman K. James, Liberty Hill, TX (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method of and a system for testing semiconductor devices heat a plurality of devices to a burn-in temperature, and perform functional tests in parallel on the plurality of devices at the burn-in temperature. Systems include a burn-in oven and a test multiplexer. The burn-in oven is adapted to receive and heat the devices to the burn-in temperature. The test multiplexer is adapted to apply functional test signals to and receive output signals from the devices in the burn-in oven.