The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2009
Filed:
Apr. 12, 2007
James E. Hopkins, Mesa, AZ (US);
Michael Peter Costello, Queen Creek, AZ (US);
Herbert Tsai, Kaohsiung, TW;
Ching-too Chen, Chandler, AZ (US);
James E. Hopkins, Mesa, AZ (US);
Michael Peter Costello, Queen Creek, AZ (US);
Herbert Tsai, Kaohsiung, TW;
Ching-Too Chen, Chandler, AZ (US);
Chroma Ate Inc, Taoyuan Hsien, TW;
Abstract
Apparatus for testing System-In-Package (SIP) devices each having a plurality of electrical leads is described. The apparatus utilizes industry standard JEDEC trays and tests all devices in such trays at the same time. The apparatus of the illustrative embodiment comprises a test hive comprising: a plurality of test circuits corresponding in number to the number of cells in the tray; and a plurality of groups of test contacts, each of the groups of the test contacts being coupled to one of the test circuits and being oriented to engage the plurality of electrical contacts of SIP device disposed in a corresponding one of the cells, the test hive being operable to simultaneously, electrically test all of the SIP devices in each tray engaged by the hive without removing the SIP devices from the tray.