The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2009

Filed:

Aug. 11, 2003
Applicants:

Christian Broennimann, Ehrendingen, CH;

Bernd Schmitt, Zurich, CH;

Inventors:

Christian Broennimann, Ehrendingen, CH;

Bernd Schmitt, Zurich, CH;

Assignee:

Paul Scherrer Institut, Villigen PSI, Schweiz, unknown;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention is directed to increasing the time resolution capabilities of a photon counting imaging device. This is achieved by a photon-counting imaging device for single x-ray counting, including: a layer of photosensitive material; an N×M array of photodetector diodes arranged in the layer of the photosensitive material; an N×M array of readout unit cells including an high gain, low noise amplifying elements, one readout unit cell for each photodetector diode; the readout unit cells being controlled by a data processing elements; each readout unit cell comprising an internal data processing elements allowing to assign an output signal representing an amplifyied signal of the electron hole pairs generated by an incident photon or a predetermined number of incident photons in the respective photodetector diode to a preselectable region of interest; and the assignment of the output signal is accompanied by a time stamp generated by a clock means.


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