The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2009
Filed:
Nov. 24, 2003
Applicants:
Paul H. Shelley, Lakewood, WA (US);
Diane R. Lariviere, Seattle, WA (US);
Inventors:
Paul H. Shelley, Lakewood, WA (US);
Diane R. LaRiviere, Seattle, WA (US);
Assignee:
The Boeing Company, Chicago, IL (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 24/00 (2006.01); G01N 21/62 (2006.01); G01T 1/167 (2006.01); G01T 1/169 (2006.01); G01J 5/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method is provided for identifying contaminants on a surface. In one embodiment, an infrared beam is transmitted onto a sample. A first infrared absorbance of the sample is determined at a first wave number. A second infrared absorbance of the sample is determined at a second wave number. The first absorbance is correlated to a first absorbance peak of a contaminant. The presence of a predetermined level of the contaminant is confirmed by correlating the second infrared absorbance to a second absorbance peak of the contaminant.