The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2009
Filed:
Oct. 17, 2005
Tatsuro Baba, Otawara, JP;
Masami Takahashi, Nasushiobara, JP;
Masao Takimoto, Otawara, JP;
Muneki Kataguchi, Nasushiobara, JP;
Takuya Sasaki, Nasu-gun, JP;
Yasuo Miyajima, Utsunomiya, JP;
Takanobu Uchibori, Otawara, JP;
Tomio Nabatame, Nasu-gun, JP;
Toshiyuki Koinuma, Shimotsuga-gun, JP;
Tatsuro Baba, Otawara, JP;
Masami Takahashi, Nasushiobara, JP;
Masao Takimoto, Otawara, JP;
Muneki Kataguchi, Nasushiobara, JP;
Takuya Sasaki, Nasu-gun, JP;
Yasuo Miyajima, Utsunomiya, JP;
Takanobu Uchibori, Otawara, JP;
Tomio Nabatame, Nasu-gun, JP;
Toshiyuki Koinuma, Shimotsuga-gun, JP;
Kabushiki Kaisha Toshiba, Tokyo, JP;
Toshiba Medical Systems Corporation, Otawara-shi, JP;
Abstract
A Doppler sensitivity measuring unit measures the Doppler sensitivity of Doppler spectrum data obtained by ultrasonic wave transmission/reception with respect to a predetermined region of an object to be examined. A spectrum shape model generating unit generates a spectrum shape model on the basis of a window function used when the above Doppler spectrum data is generated. A threshold setting unit sets a threshold range in which trace waveform data displaces by a predetermined amount in the frequency axis direction on the basis of the spectrum shape model and the Doppler sensitivity, and sets a predetermined number of thresholds at almost equal intervals in the threshold range. A trace data generating unit selects a threshold for the acquisition of desired trace waveform data by generating trace waveform data while sequentially updating the plurality of set thresholds.