The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2009
Filed:
Jun. 05, 2006
Shang-hao Chen, Taoyuan, TW;
Shiu-ming Chu, Taoyuan, TW;
Shang-Hao Chen, Taoyuan, TW;
Shiu-Ming Chu, Taoyuan, TW;
Quanta Storage Inc., Guishan Shiang, TW;
Abstract
A method and the apparatus of defect areas management includes the steps as following: reading a defect area table in a random access memory; if the area is readable, then read the area. If the area is not accessible, then label and add one count in the defect area table of inability to read of the defect area, and else if the count of inability to read of the defect area is more than a predetermined value, then the defect area is defined as the area of being not to be read again. Then the defect area of being not to be read again is skipped and not to be read the next time in order to decrease the total access time.