The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2009

Filed:

Nov. 19, 2004
Applicant:

Bernd Kirchner, Erftstadt, DE;

Inventor:

Bernd Kirchner, Erftstadt, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to a device (), for the preparation, execution and evaluation of a non-destructive analysis with one or more suitable analysis devices () of any type. The device () includes an input device (), an output device (), a data store, a data processing unit (), an interface () for connection of the analysis device (), by means of which data may be transmitted in both directions and a standardised data processing programme. It is possible to generate an analysis flow scheme, by means of the data processing programme, whereby an analysis object () can be defined, various analysis regions () of the analysis object () can be determined, a particular analysis device () can be selected, analytically-relevant parameters can be selected and determined for the selected analytical device (), the type of visualisation and the analysis of the measured analytical values can be determined and the obtained analytical results can be archived and stored.


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