The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2009
Filed:
Apr. 26, 2007
Manjul Bhushan, Hopewell Junction, NY (US);
Mark B. Ketchen, Hadley, MA (US);
Manjul Bhushan, Hopewell Junction, NY (US);
Mark B. Ketchen, Hadley, MA (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
An integrated circuit device and device parameter characterization method are provided. The integrated circuit device has a padset with plurality of pads. The integrated circuit device also includes one or more arrays of devices under test, each of the one or more arrays disposed between two of the plurality of pads. The integrated circuit device further includes one or more n-bit decoders, each disposed between two of the plurality of pads and electrically coupled to a corresponding one of the one or more arrays. Each n-bit decoder comprises one or more outputs that deliver a defined voltage to each device under test in the corresponding one of the one or more arrays of devices under test. The integrated circuit device and corresponding electrical connections are implemented in a single level of metal.