The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2009
Filed:
May. 12, 2003
Eric Robert Bechhoefer, New Haven, VT (US);
Mokhtar Sadok, Williston, VT (US);
Eric Robert Bechhoefer, New Haven, VT (US);
Mokhtar Sadok, Williston, VT (US);
Simmonds Precision Products, Inc., Vergennes, VT (US);
Abstract
Described are techniques used in a wire diagnostics system to detect events, such as defects, that may occur within a wire or cable under test. An incident voltage signal is sent out on the wire and a measured voltage signal is obtained which includes the incident voltage and the reflected voltage. Compensation processing is performed on the measured waveform to remove unwanted reflective components. Additionally, the waveform is then subject to attenuation processing and event detection processing. Detected events, such as defects, are classified and output as results. Events are classified by parametric classification using a library of known events or faults. The library of known events or faults is previously generated using empirical analysis and modeling techniques. Additionally, joint time-frequency domain reflectometry (TFDR) techniques are described for event identification and classification for a wire under test.