The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2009
Filed:
Jun. 27, 2007
Wafer scale method of manufacturing optical waveguide devices and the waveguide devices made thereby
Benjamin F. Catching, Santa Rosa, CA (US);
Donald M. Friedrich, Windsor, CA (US);
Charles A. Hulse, Sebastopol, CA (US);
Marc K. Von Gunten, Los Altos, CA (US);
Jason Reed, West Hartford, CT (US);
Karl Kissa, West Simsbury, CT (US);
Glen Drake, Windsor, CT (US);
Julia Duncan, North Granby, CT (US);
William J. Minford, Windsor, CT (US);
Hiren V. Shah, Santa Rosa, CA (US);
Jerry Zieba, Santa Rosa, CA (US);
Jason Jiazhan Xu, Weatogue, CT (US);
Benjamin F. Catching, Santa Rosa, CA (US);
Donald M. Friedrich, Windsor, CA (US);
Charles A. Hulse, Sebastopol, CA (US);
Marc K. Von Gunten, Los Altos, CA (US);
Jason Reed, West Hartford, CT (US);
Karl Kissa, West Simsbury, CT (US);
Glen Drake, Windsor, CT (US);
Julia Duncan, North Granby, CT (US);
William J. Minford, Windsor, CT (US);
Hiren V. Shah, Santa Rosa, CA (US);
Jerry Zieba, Santa Rosa, CA (US);
Jason Jiazhan Xu, Weatogue, CT (US);
JDS Uniphase Corporation, Milpitas, CA (US);
Abstract
The invention relates to a wafer scale process for the manufacture of optical waveguide devices, and particularly for the manufacture of ridge waveguide devices, and the improved waveguides made thereby. The present invention has found a process for achieving sub-micron control of an optical waveguiding layer thickness by providing a dimensionally stable wafer assembly into which adhesive can be introduced without altering the planar relationship between a carrier wafer and an optically transmissive wafer in wafer scale manufacture. This process permits wafer scale manufacture of optical waveguide devices including thin optically transmissive layers. A pattern of spacer pedestals is created by a deposition and etch back, or by a surface etch process to precisely reference surface information from a master surface to a carrier wafer to a thin optically transmissive wafer. The tolerance achievable in accordance with this process provides consistent yield across the wafer.