The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7512200 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 31, 2009

Filed:

Jan. 09, 2004
Applicant:

Young-min Shin, Seoul, KR;

Inventor:

Young-min Shin, Seoul, KR;

Assignee:

Samsung Electronics Co, Ltd., Suwon, Kyungki-Do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided are a circuit and a method of detecting clock delay where the circuit to detect clock delay includes a delay detection circuit and a clock forwarding circuit, the delay detection circuit detects a delay between a predetermined output clock signal and an input clock signal, if the detected delays are identical to one another, the circuit generates an initial parameter corresponding to the delay and if the detected delays are not identical to one another, continuously detects the delay until the detected delays are identical to one another, and generates a reset control signal in response to a system reset signal or a predetermined internal reset signal; the clock forwarding circuit loads and unloads the input data in response to the initial parameter, the circuit to detect clock delay can automatically detect the clock delay necessary for setting the initial parameter of the clock forwarding circuit and reset a master circuit and an external circuit that interfaces with the master circuit, thus performing data transmission without any errors.


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Shin, Young-min. (2009). Circuit to detect clock delay and method thereof (U.S. Patent No. 7512200). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7512200

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