The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2009

Filed:

Jun. 28, 2004
Applicant:

Sassan Tabatabaei, Sunnyvale, CA (US);

Inventor:

Sassan Tabatabaei, Sunnyvale, CA (US);

Assignee:

GuideTech, Inc., Suunyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03D 1/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of estimating random jitter from measured samples of a transmitted data signal includes a first step of obtaining a plurality of measurements (e.g., pulse widths) for selected signal edges within a transmitted data stream, where the data stream comprises a repeating data pattern having a known bit length and known number of rising edges, and wherein the time difference between adjacent measurements is determined by an event count increment equal to an integer multiple of the known number of rising edges. A time interval error (TIE) value is then computed for each measured signal edge and transformed into corresponding frequency components that are representative of both noise floor and multiple distinct frequency peaks. Noise floor is isolated and the power of the noise floor may be computed to provide an estimate of random jitter variance, from which the standard deviation may be calculated.


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