The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2009

Filed:

Mar. 04, 2005
Applicants:

Yoshiaki Inoue, Odawara, JP;

Fumikazu Kobayashi, Shizuoka-ken, JP;

Ikuo Kawauchi, Fujieda, JP;

Inventors:

Yoshiaki Inoue, Odawara, JP;

Fumikazu Kobayashi, Shizuoka-ken, JP;

Ikuo Kawauchi, Fujieda, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 15/00 (2006.01); H04N 1/405 (2006.01);
U.S. Cl.
CPC ...
Abstract

A normalization threshold side size Nr which serves as an index indicative of how many times the pattern frequency r is repeated in one threshold matrix is defined as Nr=N×r/R where N represents a size of one side of the threshold matrix as the number of pixels, and the threshold array of the threshold matrix is determined such that the normalization threshold side size Nr is of an value greater than 65.


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