The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2009
Filed:
Dec. 21, 2004
Roger L. Schultz, Aubrey, TX (US);
Neal Gregory Skinner, Lewisville, TX (US);
Harry Davis Smith, Jr., Montgomery, TX (US);
Daniel David Gleitman, Houston, TX (US);
Roger L. Schultz, Aubrey, TX (US);
Neal Gregory Skinner, Lewisville, TX (US);
Harry Davis Smith, Jr., Montgomery, TX (US);
Daniel David Gleitman, Houston, TX (US);
Halliburton Energy Services, Inc., Houston, TX (US);
Abstract
An apparatus, system and method are provided for measuring state properties without requiring an internal or proximate power supply. The apparatus provides a sensing device that is responsive to fluctuations in a state property that are encountered within the test zone. Due to the fluctuations experienced by the sensing device, a sensing signal is generated and transmitted to an optical device, such as an interferometer. The sensing signal's affect on the optical device produces an interference pattern that may be detected remotely and correlated to the fluctuation experienced by the sensing device.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile